TIME-RESOLVED REFLECTIVITY STUDY OF SOLID-PHASE EPITAXIAL REGROWTH IN RELAXED AND STRAINED SI/SUB 1-X/GE/SUB X/ EPILAYERS TIME-RESOLVED REFLECTIVITY STUDY OF SOLID-PHASE EPITAXIAL REGROWTH IN RELAXED AND STRAINED SI/SUB 1-X/GE/SUB X/ EPILAYERS
Data source
Japan Atomic Energy Agency's Library Catalog
A search system for the collections of the Japan Atomic Energy Agency central library. Books, reports, meeting materials, magazines and dockets collected by the library are searchable.
Last updated
July 25, 2022