ON THE DETERMINATION OF THE PHOTO-IONIZATION ENERGY AND THE CONCENTRATION OF DEFECTS CREATED BY NUCLEAR RADIATION IN SILICON DIODES. ON THE DETERMINATION OF THE PHOTO-IONIZATION ENERGY AND THE CONCENTRATION OF DEFECTS CREATED BY NUCLEAR RADIATION IN SILICON DIODES.
Data source
Japan Atomic Energy Agency's Library Catalog
A search system for the collections of the Japan Atomic Energy Agency central library. Books, reports, meeting materials, magazines and dockets collected by the library are searchable.
Last updated
August 15, 2022