UNIFIED MODEL OF CHARGE BUILD-UP AND ANNEALING OF OXIDE CHARGE AND INTERFACE STATES IN SIO/SUB 2/ DUE TO STRESS. UNIFIED MODEL OF CHARGE BUILD-UP AND ANNEALING OF OXIDE CHARGE AND INTERFACE STATES IN SIO/SUB 2/ DUE TO STRESS.
Data source
Japan Atomic Energy Agency's Library Catalog
A search system for the collections of the Japan Atomic Energy Agency central library. Books, reports, meeting materials, magazines and dockets collected by the library are searchable.
Last updated
August 15, 2022