HIGH RESOLUTION ELECTRON MICROSCOPY STUDY OF THE SI-SIO2 INTERFACE. HIGH RESOLUTION ELECTRON MICROSCOPY STUDY OF THE SI-SIO2 INTERFACE.
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Japan Atomic Energy Agency's Library Catalog
A search system for the collections of the Japan Atomic Energy Agency central library. Books, reports, meeting materials, magazines and dockets collected by the library are searchable.
Last updated
August 29, 2022