SOME PROPERTIES OF SILICON ON SAPPHIRE FILMS DETERMINED BY LOW FREQUENCY NOISE MEASUREMENTS.:IEEE SOS WORKSHOP. VAIL, CO SOME PROPERTIES OF SILICON ON SAPPHIRE FILMS DETERMINED BY LOW FREQUENCY NOISE MEASUREMENTS.:IEEE SOS WORKSHOP. VAIL, CO
Data source
Japan Atomic Energy Agency's Library Catalog
A search system for the collections of the Japan Atomic Energy Agency central library. Books, reports, meeting materials, magazines and dockets collected by the library are searchable.
Last updated
July 25, 2022